Active probe atomic force microscopy : A practical guide on precision intrumentation / Fangzhou Xia, Ivo W. Rangelow and Kamal Youcef-Toumi

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TextLanguage: English Publication details: Swizerland : Springer , 2024 . Description: 366pISBN:

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Item type	Current library	Collection	Call number	Status	Barcode
Reference	JC Bose University of Science & Technology	Reference	537.533 XIA (Browse shelf(Opens below))	Not For Loan	59664

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