<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[ Search for 'su:&quot;Instrumentation &quot;']]> </title> <link> /cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Instrumentation%20%22&#38;sort_by=relevance&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Instrumentation%20%22&#38;sort_by=relevance&#38;format=rss"/> <description> <![CDATA[ Search results for 'su:&quot;Instrumentation &quot;' at ]]> </description> <opensearch:totalResults>38</opensearch:totalResults> <opensearch:startIndex>20</opensearch:startIndex> <opensearch:itemsPerPage>20</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Instrumentation%20%22&#38;sort_by=relevance&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dsu%253A%2522Instrumentation%2520%2522" startPage="" /> <item> <title> Instrumentation measurement and analysis </title> <dc:identifier>ISBN:9780070151277</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=12558</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/007015127X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Nakra, B C.<br /> New Delhi TMH 2010 .<br /> 641p 9780070151277 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=12558">Place hold on <em>Instrumentation measurement and analysis</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=12558</guid> </item> <item> <title> Instrumentation measurement and analysis </title> <dc:identifier>ISBN:9780070151277</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=12638</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/007015127X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Nakra, B C.<br /> New Delhi TMH 2010 .<br /> 641p 9780070151277 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=12638">Place hold on <em>Instrumentation measurement and analysis</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=12638</guid> </item> <item> <title> Electronic measurements and instrumentation </title> <dc:identifier>ISBN:</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=12907</link> <description> <![CDATA[ <p> By Oliver, Bernard M.<br /> New Delhi TMH 1971 .<br /> 729 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=12907">Place hold on <em>Electronic measurements and instrumentation</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=12907</guid> </item> <item> <title> Fundamentals of industrial instrumentation and process control </title> <dc:identifier>ISBN:</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=12910</link> <description> <![CDATA[ <p> By Dunn, William C.<br /> New Delhi TMH 2005 .<br /> 322 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=12910">Place hold on <em>Fundamentals of industrial instrumentation and process control</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=12910</guid> </item> <item> <title> Course in electrical and electronic measurements and instrumentaion </title> <dc:identifier>ISBN:</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=12997</link> <description> <![CDATA[ <p> By Sawhney, A.K..<br /> New Delhi Dhanpat Rai 2011 .<br /> 1320p. </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=12997">Place hold on <em>Course in electrical and electronic measurements and instrumentaion</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=12997</guid> </item> <item> <title> Mechanical measurements and instrumentation </title> <dc:identifier>ISBN:9789350142851</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=13034</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9350142856.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Rajput, R K.<br /> New Delhi SKK 2012 .<br /> 846 9789350142851 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=13034">Place hold on <em>Mechanical measurements and instrumentation</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=13034</guid> </item> <item> <title> Course in mechanical measurements and instrumentation and control </title> <dc:identifier>ISBN:</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=13449</link> <description> <![CDATA[ <p> By Sawhney, A.K..<br /> Delhi Dhanpat Rai 2001 .<br /> 940p. </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=13449">Place hold on <em>Course in mechanical measurements and instrumentation and control</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=13449</guid> </item> <item> <title> Measurement systems </title> <dc:identifier>ISBN:9780070699687</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=14005</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0070699682.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Doebelin, Ernest O.<br /> New Delhi McGraw Hill 2011 .<br /> 760 9780070699687 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=14005">Place hold on <em>Measurement systems</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=14005</guid> </item> <item> <title> Measurement systems </title> <dc:identifier>ISBN:9780070699687</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=14115</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0070699682.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Doebelin, Ernest O.<br /> New Delhi McGraw Hill 2011 .<br /> 760 9780070699687 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=14115">Place hold on <em>Measurement systems</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=14115</guid> </item> <item> <title> Course in electrical and electronic measurements and instrumentaion </title> <dc:identifier>ISBN:97881-7700100-6</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=14293</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8177001000.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Sawhney, A.K..<br /> New Delhi Dhanpat Rai 2011 .<br /> 1320p. , Reprint-2016 97881-7700100-6 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=14293">Place hold on <em>Course in electrical and electronic measurements and instrumentaion</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=14293</guid> </item> <item> <title> Gate instrumentation engineering MCQs (Multiple choice questionwith detailed solutions </title> <dc:identifier>ISBN:9788123923574</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=15420</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8123923570.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Karna, Satish K.<br /> New Delhi CBS 2014 .<br /> 972 9788123923574 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=15420">Place hold on <em>Gate instrumentation engineering MCQs (Multiple choice questionwith detailed solutions</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=15420</guid> </item> <item> <title> Discrete time system and signals processing </title> <dc:identifier>ISBN:9789385259913</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=15567</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9385259911.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Palani, S.<br /> New Delhi Ane Books 2015 .<br /> vp 9789385259913 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=15567">Place hold on <em>Discrete time system and signals processing</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=15567</guid> </item> <item> <title> Measurement and instrumentation trends and applications </title> <dc:identifier>ISBN:9788180522567</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=15569</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8180522563.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Ghosh, M K.<br /> New Delhi Ane Books 2008 .<br /> 666 9788180522567 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=15569">Place hold on <em>Measurement and instrumentation</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=15569</guid> </item> <item> <title> Virtual instrumentation using lab view 2E </title> <dc:identifier>ISBN:9780071336727</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=16521</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0071336729.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Gupta, Sanjay.<br /> .<br /> 228p. 9780071336727 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=16521">Place hold on <em>Virtual instrumentation using lab view 2E</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=16521</guid> </item> <item> <title> Electronic measurements and instrumentation systems </title> <dc:identifier>ISBN:9789386173621</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=16877</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/938617362X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Joshi, J G.<br /> New Delhi Khanna book publishing 2000 .<br /> 329 p. 9789386173621 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=16877">Place hold on <em>Electronic measurements and instrumentation systems</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=16877</guid> </item> <item> <title> Design instrumentation and controls </title> <dc:identifier>ISBN:9781680943832</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=20297</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1680943839.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Randrianaanarisoa, Harinirina.<br /> New York Arcler 2017 .<br /> 223p. 9781680943832 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=20297">Place hold on <em>Design instrumentation and controls </em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=20297</guid> </item> <item> <title> Electronic instrumentation and measurements </title> <dc:identifier>ISBN:9781682513866</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=20307</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1682513866.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Jones, Alan.<br /> New York Intelliz 2018 .<br /> 279p. 9781682513866 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=20307">Place hold on <em>Electronic instrumentation and measurements</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=20307</guid> </item> <item> <title> Microcontrollers and embedded system design </title> <dc:identifier>ISBN:9789385909702</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=20528</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9385909703.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Bahadure, Nilesh Bhaskarrao.<br /> New Delhi Techsar 2019 .<br /> 828p. 9789385909702 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=20528">Place hold on <em>Microcontrollers and embedded system design </em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=20528</guid> </item> </channel> </rss>
