<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[ Search for 'pl:&quot;Baca Raton &quot;']]> </title> <link> /cgi-bin/koha/opac-search.pl?q=ccl=pl%3A%22Baca%20Raton%20%22&#38;sort_by=relevance&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=pl%3A%22Baca%20Raton%20%22&#38;sort_by=relevance&#38;format=rss"/> <description> <![CDATA[ Search results for 'pl:&quot;Baca Raton &quot;' at ]]> </description> <opensearch:totalResults>4</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=pl%3A%22Baca%20Raton%20%22&#38;sort_by=relevance&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dpl%253A%2522Baca%2520Raton%2520%2522" startPage="" /> <item> <title> Engineering noise control </title> <dc:identifier>ISBN:9781498724050</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=18354</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1498724051.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Bies, David A..<br /> Baca Raton CRC Press 2018 .<br /> 826p. 9781498724050 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=18354">Place hold on <em>Engineering noise control</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=18354</guid> </item> <item> <title> Measure and integral An introduction to real analysis </title> <dc:identifier>ISBN:9781032941622</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=20759</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1032941626.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Wheedom, Richard L..<br /> Baca Raton CRC PRess 2015 .<br /> 514p. 9781032941622 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=20759">Place hold on <em>Measure and integral</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=20759</guid> </item> <item> <title> Carbohydrate Chemistry : Proven Synthesis methods </title> <dc:identifier>ISBN:9781138705852</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=20808</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1138705853.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Roy, Rene and Vidal, Sebastien ed..<br /> Baca Raton CRC 2011 .<br /> 281p, 9781138705852 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=20808">Place hold on <em>Carbohydrate Chemistry : Proven Synthesis methods </em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=20808</guid> </item> <item> <title> Semiconductor devices in Harsh conditions </title> <dc:identifier>ISBN:9781498743808</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=20840</link> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1498743803.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Weide-Zaage, Kristen ed..<br /> Baca Raton CRC Press 2017 .<br /> 234p, 9781498743808 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=20840">Place hold on <em>Semiconductor devices in Harsh conditions </em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=20840</guid> </item> </channel> </rss>
