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Electron Nano-imaging : Basic of imaging and diffraction for TEM and STEM

By: Material type: TextTextLanguage: English Publication details: Japan : Springer , 2024 . Edition: 2nd edDescription: 384pISBN:
  • 9784431569398
Subject(s): DDC classification:
  • 621.382 TAN
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Holdings
Item type Current library Collection Call number Status Barcode
Reference Reference JC Bose University of Science & Technology Non-fiction 621.382 TAN (Browse shelf(Opens below)) Not For Loan 58566

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