Design-for-test for digital IC's and embedded core systems (Record no. 16656)

MARC details
000 -LEADER
fixed length control field 00543nam a2200205Ia 4500
001 - CONTROL NUMBER
control field 120077
003 - CONTROL NUMBER IDENTIFIER
control field YMCAF
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20230512163721.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 191223s1999 ||||||||||||||||| ||und|d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780130848271
024 ## - OTHER STANDARD IDENTIFIER
Standard number or code 120077
035 ## - SYSTEM CONTROL NUMBER
System control number EB143
040 ## - CATALOGING SOURCE
Original cataloging agency YMCAF
Language of cataloging eng
Transcribing agency IN-KoLT
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Crouch, Alfred L.
245 #0 - TITLE STATEMENT
Title Design-for-test for digital IC's and embedded core systems
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Noida
Name of publisher, distributor, etc. Pearson India Education Services Pvt. Ltd
Date of publication, distribution, etc. 1999
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Computer science
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Total Checkouts Barcode Date last seen Price effective from Koha item type Public note
        JC Bose University of Science & Technology JC Bose University of Science & Technology 23/12/2019   EB143 12/05/2023 12/05/2023   C

Powered by Koha