Normal view MARC view ISBD view

Key concepts of scanning electron microscopy

Page, Lisa (Ed.)

Key concepts of scanning electron microscopy - New York NY Research Press 2015 - 246

ISBN: 978-163238306-8

Standard No.: 119044

Dewey Class. No.: 502.825 / KEY

Print
Add to your cart (remove)
Suggest for purchase
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)